Advanced Computing in Electron Microscopy

Author: Earl J. Kirkland
Publisher: Springer Science & Business Media
ISBN: 9780306459368
Format: PDF, ePub
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Image simulation has become a common tool in HREM (High Resolution Electron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is difficult for beginners to get started in this field. The principle method of image simulation has come to be known as simply the multislice method. This book attempts to bring the diverse information on image simulation together into one place and to provide a background on how to use the multislice method to simulate high resolution images in both conventional and scanning transmission electron microscopy. The main goals of image simulation include understanding the microscope and interpreting high resolution information in the recorded micrographs. This book contains sections on the theory of image formation and simulation as well as a more practical introduction on how to use the multislice method on real specimens. Also included with this book is a CD-ROM with working programs to perform image simulation. The source code as well as the executable code for IBM-PC and Apple Macintosh computers is included. Although the programs may not have a very elegant user interface by today's standards (simple command line dialog), the source code should be very portable to a variety of different computers. It has been compiled and run on Mac's, PC's and several different types of UNIX computers.

Aberration Corrected Imaging in Transmission Electron Microscopy

Author: Rolf Erni
Publisher: World Scientific Publishing Company
ISBN: 1783265302
Format: PDF, Kindle
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Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging. This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.

Minerals at the Nanoscale

Author: F. Nieto
Publisher: The Mineralogical Society of Great Britain and Ireland
ISBN: 0903056348
Format: PDF, Docs
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The editors have gathered in this book, reviews of past and current studies of mineral groups that have played important roles in geology, environmental science and health science. The various chapters cover the application of TEM and related techniques to: mineral groups in which TEM investigations have been extensive and crucial to the understanding of their mineralogy, namely pyriboles, serpentines, clays, micas and other metamorphic phyllosilicates, oxides and oxyhydroxides, sulfides and carbonates. Some research fields for which TEM is particularly suitable and which have produced significant advances, in particular, are inclusions and traces, extraterrestrial material, deformation processes, non-stoichiometry and superstructures, and biominerals. Nowadays, we are witnessing the push for the improvement of detectors for imaging (direct detection of electrons) and X-rays (silicon drift detectors and annular high solid-angle of collection detectors), the development of new support materials (e.g. graphene) and liquid cells for TEMs. Most of these new technologies have not yet been applied to mineralogical problems but we hope they will be in the near future.

Intelligent Analysis of Multimedia Information

Author: Bhattacharyya, Siddhartha
Publisher: IGI Global
ISBN: 1522504990
Format: PDF, Docs
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Multimedia represents information in novel and varied formats. One of the most prevalent examples of continuous media is video. Extracting underlying data from these videos can be an arduous task. From video indexing, surveillance, and mining, complex computational applications are required to process this data. Intelligent Analysis of Multimedia Information is a pivotal reference source for the latest scholarly research on the implementation of innovative techniques to a broad spectrum of multimedia applications by presenting emerging methods in continuous media processing and manipulation. This book offers a fresh perspective for students and researchers of information technology, media professionals, and programmers.

Analytische Transmissionselektronenmikroskopie

Author: Jürgen Thomas
Publisher: Springer-Verlag
ISBN: 3709114403
Format: PDF, Docs
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Die Autoren des Buches fassen ihre im Zuge vielseitiger Lehrtätigkeit gesammelten Erfahrungen zu häufig gestellten Fragen und Problemen von Anfängern im Umgang mit dem analytischen Transmissionselektronenmikroskop anschaulich zusammen. Dabei bilden Erklärungen anhand einfacher Modellvorstellungen und Hinweise zur praktischen Umsetzung des Erlernten die Schwerpunkte des Buches. Dieses praxisnahe Lehrbuch bietet somit eine klare und verständliche Einführung für all jene, die für Ihre Arbeit das Transmissionselektronenmikroskop verwenden wollen, jedoch noch nicht speziell dafür ausgebildet sind.

Physikalisches Praktikum

Author: Wolfgang Schenk
Publisher: Springer-Verlag
ISBN: 3658006668
Format: PDF
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Dieses erfolgreiche Praktikumsbuch bewährt sich seit vielen Jahren bei Studierenden der Physik sowie anderer naturwissenschaftlicher Studiengänge und des Lehramts, die ein physikalisches Grundpraktikum absolvieren. Vielfach genutzt wird es auch von Studierenden der Ingenieurwissenschaften an Technischen Universitäten und Fachhochschulen. In der vorliegenden 14. Auflage wurden Änderungen bzw. Ergänzungen im Text und in einigen Abbildungen vorgenommen, die zur Verbesserung der Darstellung einiger Inhalte beitragen sollen. Die bisherigen Onlinematerialien zum Buch wurden durch zusätzliche Ergänzungen zu ausgewählten Themen (z. B. Simulationsprogramm zum nichtlinearen Drehpendel nach Pohl, Fourier-Transformation und -Analyse, Ermittlung der Unsicherheit bei Messungen, Begründungen von Gleichungen) erweitert.