Advanced Mathematical and Computational Tools in Metrology and Testing X

Author: Franco Pavese
Publisher: World Scientific
ISBN: 9814678635
Format: PDF
Download Now
This volume contains original and refereed contributions from the tenth AMCTM Conference (http://www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards. Contents:Fostering Diversity of Thought in Measurement Science (F Pavese and P De Bièvre)Polynomial Calibration Functions Revisited: Numerical and Statistical Issues (M G Cox and P Harris)Empirical Functions with Pre-Assigned Correlation Behaviour (A B Forbes)Models and Methods of Dynamic Measurements: Results Presented by St. Petersburg Metrologists (V A Granovskii)Interval Computations and Interval-Related Statistical Techniques: Estimating Uncertainty of the Results of Data Processing and Indirect Measurements (V Ya Kreinovich)Classification, Modeling and Quantification of Human Errors in Chemical Analysis (I Kuselman)Application of Nonparametric Goodness-of-Fit Tests: Problems and Solution (B Yu Lemeshko)Dynamic Measurements Based on Automatic Control Theory Approach (A L Shestakov)Models for the Treatment of Apparently Inconsistent Data (R Willink)Model for Emotion Measurements in Acoustic Signals and Its Analysis (Y Baksheeva, K Sapozhnikova and R Taymanov)Uncertainty Calculation in Gravimetric Microflow Measurements (E Batista, N Almeida, I Godinho and E Filipe)Uncertainties Propagation from Published Experimental Data to Uncertainties of Model Parameters Adjusted by the Least Squares (V I Belousov, V V Ezhela, Y V Kuyanov, S B Lugovsky, K S Lugovsky and N P Tkachenko)A New Approach for the Mathematical Alignment Machine Tool-Paths on a Five-Axis Machine and Its Effect on Surface Roughness (S Boukebbab, J Chaves-Jacob, J-M Linares and N Azzam)Goodness-of-Fit Tests for One-Shot Device Testing Data (E V Chimitova and N Balakrishan)Calculation of Coverage Intervals: Some Study Cases (A Stepanov, A Chunovkina and N Burmistrova)Application of Numerical Methods in Metrology of Electromagnetic Quantities (M Cundeva-Blajer)Calibration Method of Measuring Instruments in Operating Conditions (A A Danilov, Yu V Kucherenko, M V Berzhinskaya, N P Ordinartseva)Statistical Methods for Conformity Assessment When Dealing with Computationally Expensive Systems: Application to a Fire Engineering Case Study (S Demeyer, N Fischer, F Didieux and M Binacchi)Overview of EMRP Joint Reserch Project NEW06 "Traceability for Computationally-Intensive Metrology" (A B Forbes, I M Smith, F Härtig and K Wendt)Stable Units of Account for Economic Value Correct Measuring (N Hovanov)A Novel Approach for Uncertainty Evaluation Using Characteristic Function Theory (A B Ionov, N S Chernysheva and B P Ionov)Estimation of Test Uncertainty for TraCIM Reference Pairs (F Keller, K Wendt and F Härtig)Approaches for Assigning Numerical Uncertainty to Reference Data Pairs for Software Validation (G J P Kok and I M Smith)Uncertainty Evaluation for a Computationally Expensive Model of a Sonic Nozzle (G J P Kok and N Pelevic)EllipseFit4HC: A MATLAB Algorithm for Demodulation and Uncertainty Evaluation of the Quadrature Interferometer Signals (R Köning, G Wimmer and V Witkovský)Considerations on the Influence of Test Equipment Instability and Calibration Methods on Measurement Uncertainty of the Test Laboratory (A S Krivov, S V Marinko and I G Boyko)A Cartesian Method to Improve the Results and Save Computation Time in Bayesian Signal Analysis (G A Kyriazis)The Definition of the Reliability of Identification of Complex Organic Compounds Using HPLC and Base Chromatographic and Spectral Data (E V Kulyabina and Yu A Kudeyarov)Uncertainty Evaluation of Fluid Dynamic Simulation with One-Dimensional Riser Model by Means of Stochastic Differential Equations (E A O Lima, S B Melo, C C Dantas, F A S Teles and S Soares Bandiera)Simulation Method to Estimate the Uncertainties of ISO Specifications (J-M Linares and J M Sprauel)Adding a Virtual Layer in a Sensor Network to Improve Measurement Reliability (U Maniscalco and R Rizzo)Calibration Analysis of a Computational Optical System Applied in the Dimensional Monitoring of a Suspension Bridge (L L Martins, J M Rebordão and A S Ribeiro)Determination of Numerical Uncertainty Associated with Numerical Artefacts for Validating Coordinate Metrology Software (H D Minh, I M Smith and A B Forbes)Least-Squares Method and Type B Evaluation of Standard Uncertainty (R Palenčár, S Ďuriš, P Pavlásek, M Dovica, S Slosarčík and G Wimmer)Optimising Measurement Processes Using Automated Planning (S Parkinson, A Crampton and A P Longstaff)Software Tool for Conversion of Historical Temperature Scales (P Pavlásek, S Ďuriš, R Palenčár and A Merlone)Few Measurements, Non-Normality: A Statement on the Expanded Uncertainty (J Petry, B De Boeck, M Dobre and A Peruzzi)Quantifying Uncertainty in Accelerometer Sensitivity Studies (A L Rukhin and D J Evans)Metrological Aspects of Stopping Iterative Procedures in Inverse Problems for Static-Mode Measurements (K K Semenov)Inverse Problems in Theory and Practice of Measurements and Metrology (K K Semenov, G N Solopchenko and V Ya Kreinovich)Fuzzy Intervals as Foundation of Metrological Support for Computations with Inaccurate Data (K K Semenov, G N Solopchenko and V Ya Kreinovich)Testing Statistical Hypotheses for Generalized Semiparametric Proportional Hazards Models with Cross-Effect of Survival Functions (M A Semenova and E V Chimitova)Novel Reference Value and DOE Determination by Model Selection and Posterior Predictive Checking (K Shirono, H Tanaka, M Shiro and K Ehara)Certification of Algorithms for Constructing Calibration Curves of Measuring Instruments (T Siraya)Discrete and Fuzzy Encoding of the ECG-Signal for Multidisease Diagnostic System (V Uspenskiy, K Vorontsov, V Tselykh and V Bunakov)Application of Two Robust Methods in Inter-Laboratory Comparisons with Small Samples (E T Volodarsky and Z L Warsza)Validation of CMM Evaluation Software Using TraCIM (K Wendt, M Franke and F Härtig)Semi-Parametric Polynomial Method for Retrospective Estimation of the Change-Point of Parameters of Non-Gaussian Sequences (S V Zabolotnii and Z L Warsza)Use of a Bayesian Approach to Improve Uncertainty of Model-Based Measurements by Hybrid Multi-Tool Metrology (N-F Zhang, B M Barnes, R M Silver and H Zhou)Application of Effective Number of Observations and Effective Degrees of Freedom for Analysis of Autocorrelated Observations (A Zieba) Readership: Researchers, graduate students, academics and professionals in metrology. Key Features:Unique consolidated series of books (started in 1993) in mathematics, statistics and software specifically for metrology and testingAuthors are among the most prominent in the metrology and testing fieldsNo competing books in the same comprehensive fieldKeywords:Mathematics;Statistics;Modeling;Uncertainty;Metrology;Testing;Computational Tools;Measurement Science

Advanced Mathematical and Computational Tools in Metrology and Testing X

Author: Franco Pavese
Publisher: Series on Advances in Mathemat
ISBN: 9789814678612
Format: PDF, ePub, Docs
Download Now
This volume contains original and refereed contributions from the tenth AMCTM Conference (http: //www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.

Advanced Mathematical and Computational Tools in Metrology and Testing IX

Author: Franco Pavese
Publisher: World Scientific
ISBN: 9814397946
Format: PDF, ePub
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This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.

Advanced Mechatronics Solutions

Author: Ryszard Jabłoński
Publisher: Springer
ISBN: 3319239236
Format: PDF, ePub, Docs
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Focusing on the most rapidly changing areas of mechatronics, this book discusses signals and system control, mechatronic products, metrology and nanometrology, automatic control & robotics, biomedical engineering, photonics, design manufacturing and testing of MEMS. It is reflected in the list of contributors, including an international group of 302 leading researchers representing 12 countries. The book is intended for use in academic, government and industry R&D departments, as an indispensable reference tool for the years to come. Thid volume can serve a global community as the definitive reference source in Mechatronics. The book comprises carefully selected 93 contributions presented at the 11th International Conference Mechatronics 2015, organized by Faculty of Mechatronics, Warsaw University of Technology, on September 21-23, in Warsaw, Poland.

Advanced Mathematical Computational Tools in Metrology VII

Author: P. Ciarlini
Publisher: World Scientific
ISBN: 9812566740
Format: PDF, Mobi
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This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in modern metrology. Contents: Modeling Measurement Processes in Complex Systems with Partial Differential Equations: From Heat Conduction to the Heart (M Baer et al.); Mereotipological Approach for Measurement Software (E Benoit & R Dapoigny); Data Evaluation of Key Comparisons Involving Several Artefacts (M G Cox et al.); Box-Cox Transformations Versus Robust Control Charts in Statistical Process Control (M I Gomes & F O Figueiredo); Decision Making Using Sensor's Data Fusion and Kohonen Self Organizing Maps (P S Girao et al.); Generic System Design for Measurement Databases Applied to Calibrations in Vacuum Metrology, Bio-Signals and a Template System (H Gro et al.); Repeated Measurements: Evaluation of Their Uncertainty from the Viewpoints of Classical and Bayesian Statistics (I Lira & W Woger); Detection of Outliers in Interlaboratory Testing and Some Thoughts About Multivariate Precision (C Perruchet); On Appropriate Methods for the Validation of Metrological Software (D Richter et al.); Data Analysis-A Dialogue (D S Sivia); Validation of a Virtual Sensor for Monitoring Ambient Parameters (P Ciarlini et al.); Evaluation of Standard Uncertainties in Nested Structures (E Filipe); Linking GUM and ISO 5725 (A B Forbes); Monte Carlo Study on Logical and Statistical Correlation (B Siebert et al.); Some Problems Concerning the Estimate of the Uncertainty of the Degree of Equivalence in MRA Key Comparisons (F Pavese); Preparing for a European Research Area Network in Metrology: Where are We Now? (M Kuhne et al.); and other papers. Readership: Researchers, graduate students, academics and professionals in metrology.

Advanced Mechatronics Solutions

Author: Ryszard Jabłoński
Publisher: Springer
ISBN: 3319239236
Format: PDF
Download Now
Focusing on the most rapidly changing areas of mechatronics, this book discusses signals and system control, mechatronic products, metrology and nanometrology, automatic control & robotics, biomedical engineering, photonics, design manufacturing and testing of MEMS. It is reflected in the list of contributors, including an international group of 302 leading researchers representing 12 countries. The book is intended for use in academic, government and industry R&D departments, as an indispensable reference tool for the years to come. Thid volume can serve a global community as the definitive reference source in Mechatronics. The book comprises carefully selected 93 contributions presented at the 11th International Conference Mechatronics 2015, organized by Faculty of Mechatronics, Warsaw University of Technology, on September 21-23, in Warsaw, Poland.

Challenges in Automation Robotics and Measurement Techniques

Author: Roman Szewczyk
Publisher: Springer
ISBN: 3319293575
Format: PDF, Docs
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This book presents the set of papers accepted for presentation at the International Conference Automation, held in Warsaw, 2-4 March of 2016. It presents the research results presented by top experts in the fields of industrial automation, control, robotics and measurement techniques. Each chapter presents a thorough analysis of a specific technical problem which is usually followed by numerical analysis, simulation, and description of results of implementation of the solution of a real world problem. The presented theoretical results, practical solutions and guidelines will be valuable for both researchers working in the area of engineering sciences and for practitioners solving industrial problems.

Recent Advances in Systems Control and Information Technology

Author: Roman Szewczyk
Publisher: Springer
ISBN: 3319489232
Format: PDF, Kindle
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This book presents the proceedings of the International Conference on Systems, Control and Information Technologies 2016. It includes research findings from leading experts in the fields connected with INDUSTRY 4.0 and its implementation, especially: intelligent systems, advanced control, information technologies, industrial automation, robotics, intelligent sensors, metrology and new materials. Each chapter offers an analysis of a specific technical problem followed by a numerical analysis and simulation as well as the implementation for the solution of a real-world problem.

Computer Vision

Author: Richard Szeliski
Publisher: Springer
ISBN: 9781848829466
Format: PDF, Mobi
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Humans perceive the three-dimensional structure of the world with apparent ease. However, despite all of the recent advances in computer vision research, the dream of having a computer interpret an image at the same level as a two-year old remains elusive. Why is computer vision such a challenging problem and what is the current state of the art? Computer Vision: Algorithms and Applications explores the variety of techniques commonly used to analyze and interpret images. It also describes challenging real-world applications where vision is being successfully used, both for specialized applications such as medical imaging, and for fun, consumer-level tasks such as image editing and stitching, which students can apply to their own personal photos and videos. More than just a source of “recipes,” this exceptionally authoritative and comprehensive textbook/reference also takes a scientific approach to basic vision problems, formulating physical models of the imaging process before inverting them to produce descriptions of a scene. These problems are also analyzed using statistical models and solved using rigorous engineering techniques Topics and features: structured to support active curricula and project-oriented courses, with tips in the Introduction for using the book in a variety of customized courses; presents exercises at the end of each chapter with a heavy emphasis on testing algorithms and containing numerous suggestions for small mid-term projects; provides additional material and more detailed mathematical topics in the Appendices, which cover linear algebra, numerical techniques, and Bayesian estimation theory; suggests additional reading at the end of each chapter, including the latest research in each sub-field, in addition to a full Bibliography at the end of the book; supplies supplementary course material for students at the associated website, http://szeliski.org/Book/. Suitable for an upper-level undergraduate or graduate-level course in computer science or engineering, this textbook focuses on basic techniques that work under real-world conditions and encourages students to push their creative boundaries. Its design and exposition also make it eminently suitable as a unique reference to the fundamental techniques and current research literature in computer vision.

Automation 2018

Author: Roman Szewczyk
Publisher: Springer
ISBN: 3319771795
Format: PDF, Kindle
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This book consists of papers presented at Automation 2018, an international conference held in Warsaw from March 21 to 23, 2018. It discusses the radical technological changes occurring due to the INDUSTRY 4.0, with a focus on offering a better understanding of the Fourth Industrial Revolution. Each chapter presents a detailed analysis of interdisciplinary knowledge, numerical modeling and simulation as well as the application of cyber-physical systems, where information technology and physical devices create synergic systems leading to unprecedented efficiency. The theoretical results, practical solutions and guidelines presented are valuable for both researchers working in the area of engineering sciences and practitioners looking for solutions to industrial problems.