Advances in Imaging and Electron Physics

Author:
Publisher: Academic Press
ISBN: 9780080525440
Format: PDF, ePub
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Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics

Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 9780080462769
Format: PDF, ePub, Mobi
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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Intense Electron and Ion Beams

Author: Sergey Ivanovich Molokovsky
Publisher: Springer Science & Business Media
ISBN: 9783540242208
Format: PDF, ePub, Mobi
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Intense Ion and Electron Beams treats intense charged-particle beams used in vacuum tubes, particle beam technology and experimental installations such as free electron lasers and accelerators. It addresses, among other things, the physics and basic theory of intense charged-particle beams; computation and design of charged-particle guns and focusing systems; multiple-beam charged-particle systems; and experimental methods for investigating intense particle beams. The coverage is carefully balanced between the physics of intense charged-particle beams and the design of optical systems for their formation and focusing. It can be recommended to all scientists studying or applying vacuum electronics and charged-particle beam technology, including students, engineers, and researchers.

Electron Backscatter Diffraction in Materials Science

Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 9780306464874
Format: PDF, Mobi
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Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).

Walford s Guide to Reference Material Science and technology

Author: Albert John Walford
Publisher: London : Library Association Pub.
ISBN:
Format: PDF, Mobi
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A revised and updated guide to reference material. It contains selective and evaluative entries to guide the enquirer to the best source of reference in each subject area, be it journal article, CD-ROM, on-line database, bibliography, encyclopaedia, monograph or directory. It features full critical annotations and reviewers' comments and comprehensive author-title and subject indexes. The contents include: mathematics; astronomy and surveying; physics; chemistry; earth sciences; palaeontology; anthropology; biology; natural history; botany; zoology; patents and interventions; medicine; engineering; transport vehicles; agriculture and livestock; household management; communication; chemical industry; manufactures; industries, trades and crafts; and the building industry.