Advances in Imaging and Electron Physics

Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 9780080458403
Format: PDF, ePub
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Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 9780128171776
Format: PDF, Kindle
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Advances in Imaging and Electron Physics, Volume 209, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing

Principles of Electron Optics

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 9780080962436
Format: PDF, Mobi
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This is a complete handbook and reference volume which covers everything that one needs to know about electron optics. It is a comprehensive coverage of theoretical background and modern computing methods. It contains a detailed and unique account of numerical methods and an extensive bibliography.

The Beginnings of Electron Microscopy

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 1483284654
Format: PDF, Kindle
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The Beginnings of Electron Microscopy presents the technical development of electron microscope. This book examines the mechanical as well as the technical problems arising from the physical properties of the electron. Organized into 19 chapters, this book begins with an overview of the history of scanning electron microscopy and electron beam microanalysis. This text then explains the applications and capabilities of electron microscopes during the war. Other chapters consider the classical techniques of light microscopy. This book presents as well the schematic outline of the preparation techniques for investigation of nerve cells by electron microscopy. The final chapter deals with the historical account of the beginnings of electron microscopy in Russia. This book is a valuable resource for scientists, technologists, physicists, electrical engineers, designers, and technicians. Graduate students as well as researcher workers who are interested in the history of electron microscopy will also find this book extremely useful.

Electron Backscatter Diffraction in Materials Science

Author: Adam J. Schwartz
Publisher: Springer Science & Business Media
ISBN: 9780306464874
Format: PDF
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Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).

The Growth of Electron Microscopy

Author:
Publisher: Academic Press
ISBN: 9780080577623
Format: PDF, ePub, Mobi
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As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).

Radiation Oncology Physics

Author: Ervin B. Podgoršak
Publisher: IAEA
ISBN:
Format: PDF, ePub, Mobi
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This publication is aimed at students and teachers involved in teaching programmes in field of medical radiation physics, and it covers the basic medical physics knowledge required in the form of a syllabus for modern radiation oncology. The information will be useful to those preparing for professional certification exams in radiation oncology, medical physics, dosimetry or radiotherapy technology.

The Fractional Fourier Transform

Author: M. Alper Kutay
Publisher: John Wiley & Sons Incorporated
ISBN: 9780471963462
Format: PDF, Docs
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The discovery of the Fractional Fourier Transform and its role in optics and data management provides an elegant mathematical framework within which to discuss diffraction and other fundamental aspects of optical systems. This book explains how the fractional Fourier transform has allowed the generalization of the Fourier transform and the notion of the frequency transform. It will serve as the standard reference on Fourier transforms for many years to come.

Progress in Medical Radiation Physics

Author: Colin Orton
Publisher: Springer Science & Business Media
ISBN: 1461576911
Format: PDF, Docs
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New developments in the application of radiation to medicine are occurring so rapidly that this is possibly the fastest growing branch of medicine today. In the past decade alone, we have seen enormous progress made in tech niques used both for the diagnosis of disease, such as computerized tomography, digital radiography, ultrasonography, computerized nuclear medicine scanning, and nuclear magnetic resonance imaging, and for its treatment, such as the radiotherapeutic utilization of high-LET radiations, and the widespread application of computers to perform elegant dosimetry calculations for 3-D treatment planning and imaging. This series will provide in-depth reviews of the many spectacular technical advances and sophisticated concepts, which are developing in medical radiation physics at such an alarming rate that it has become increasingly difficult to keep one's knowledge up-to-date. These comprehen sive review articles will help to bridge the communications gap between the international research community, and the medical physicists and phy sicians whose responsibility it is to put these advances into clinical use. These articles should also be of value to the increasing number of physical scientists and engineers who are interested in the application of their knowledge and talents to the field of medicine.