ESD from A to Z

Author: John M. Kolyer
Publisher: Springer Science & Business Media
ISBN: 1461311772
Format: PDF, ePub, Mobi
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Existing sections in ESD Frim A to Z have been thoroughly revised and updated. New examples have been added to the troubleshooting chapter; and new versions of model specifications for ESD-safe handling and packaging can be found in the specifications chapter. The Appendix now includes ten recently published papers (making a total of 20) whose topics span the field of ESD control.

Content Based Access to Multimedia Information

Author: Brad Perry
Publisher: Springer Science & Business Media
ISBN: 1461550351
Format: PDF
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In the past five years, the field of electrostatic discharge (ESD) control has under gone some notable changes. Industry standards have multiplied, though not all of these, in our view, are realistic and meaningful. Increasing importance has been ascribed to the Charged Device Model (CDM) versus the Human Body Model (HBM) as a cause of device damage and, presumably, premature (latent) failure. Packaging materials have significantly evolved. Air ionization techniques have improved, and usage has grown. Finally, and importantly, the government has ceased imposing MIL-STD-1686 on all new contracts, leaving companies on their own to formulate an ESD-control policy and write implementing documents. All these changes are dealt with in five new chapters and ten new reprinted papers added to this revised edition of ESD from A to Z. Also, the original chapters have been augmented with new material such as more troubleshooting examples in Chapter 8 and a 20-question multiple-choice test for certifying operators in Chapter 9. More than ever, the book seeks to provide advice, guidance, and practical ex amples, not just a jumble of facts and generalizations. For instance, the added tailored versions of the model specifications for ESD-safe handling and packaging are actually in use at medium-sized corporations and could serve as patterns for many readers.

Electrostatic Discharge Protection

Author: Juin J. Liou
Publisher: CRC Press
ISBN: 1482255898
Format: PDF, ePub, Docs
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Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry. Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection. Amply illustrated with tables, figures, and case studies, the text: Instills a deeper understanding of ESD events and ESD protection design principles Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions Electrostatic Discharge Protection: Advances and Applications provides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.

Reliability in Scientific Research

Author: I. R. Walker
Publisher: Cambridge University Press
ISBN: 9781139493352
Format: PDF
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Covering many techniques widely used in research, this book will help researchers in the physical sciences and engineering solve troublesome - and potentially very time consuming - problems in their work. The book deals with technical difficulties that often arise unexpectedly during the use of various common experimental methods, as well as with human error. It provides preventive measures and solutions for such problems, thereby saving valuable time for researchers. Some of the topics covered are: sudden leaks in vacuum systems, electromagnetic interference in electronic instruments, vibrations in sensitive equipment, and bugs in computer software. The book also discusses mistakes in mathematical calculations, and pitfalls in designing and carrying out experiments. Each chapter contains a summary of its key points, to give a quick overview of important potential problems and their solutions in a given area.

ESD Design and Analysis Handbook

Author: James E. Vinson
Publisher: Springer Science & Business Media
ISBN: 1461503213
Format: PDF, Kindle
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Electrostatic Discharge is a pervasive issue in the semiconductor industry affecting both manufacturers and users of semiconductors. This easy-to-read, practical handbook presents an overview of ESD as it effects electronic circuits and provides a concise introduction for students, engineers, circuit designers and failure analysts.

ESD

Author: Steven H. Voldman
Publisher: John Wiley & Sons
ISBN: 0470061391
Format: PDF
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With the growth of high-speed telecommunications and wireless technology, it is becoming increasingly important for engineers to understand radio frequency (RF) applications and their sensitivity to electrostatic discharge (ESD) phenomena. This enables the development of ESD design methods for RF technology, leading to increased protection against electrical overstress (EOS) and ESD. ESD: RF Technology and Circuits: Presents methods for co-synthesizisng ESD networks for RF applications to achieve improved performance and ESD protection of semiconductor chips; discusses RF ESD design methods of capacitance load transformation, matching network co-synthesis, capacitance shunts, inductive shunts, impedance isolation, load cancellation methods, distributed loads, emitter degeneration, buffering and ballasting; examines ESD protection and design of active and passive elements in RF complementary metal-oxide-semiconductor (CMOS), RF laterally-diffused metal oxide semiconductor (LDMOS), RF BiCMOS Silicon Germanium (SiGe), RF BiCMOS Silicon Germanium Carbon (SiGeC), and Gallim Arsenide technology; gives information on RF ESD testing methodologies, RF degradation effects, and failure mechanisms for devices, circuits and systems; highlights RF ESD mixed-signal design integration of digital, analog and RF circuitry; sets out examples of RF ESD design computer aided design methodologies; covers state-of-the-art RF ESD input circuits, as well as voltage-triggered to RC-triggered ESD power clamps networks in RF technologies, as well as off-chip protection concepts. Following the authors series of books on ESD, this book will be a thorough overview of ESD in RF technology for RF semiconductor chip and ESD engineers. Device and circuit engineers working in the RF domain, and quality, reliability and failure analysis engineers will also find it a valuable reference in the rapidly growing are of RF ESD design. In addition, it will appeal to graduate students in RF microwave technology and RF circuit design.

ESD Protection Device and Circuit Design for Advanced CMOS Technologies

Author: Oleg Semenov
Publisher: Springer Science & Business Media
ISBN: 9781402083013
Format: PDF, ePub, Mobi
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ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains. As the problems associated with ESD failures and yield losses become significant in the modern semiconductor industry, the demand for graduates with a basic knowledge of ESD is also increasing. Today, there is a significant demand to educate the circuits design and reliability teams on ESD issues. This book makes an attempt to address the ESD design and implementation in a systematic manner. A design procedure involving device simulators as well as circuit simulator is employed to optimize device and circuit parameters for optimal ESD as well as circuit performance. This methodology, described in ESD Protection Device and Circuit Design for Advanced CMOS Technologies has resulted in several successful ESD circuit design with excellent silicon results and demonstrates its strengths.

Semiconductor Manufacturing Handbook Second Edition

Author: Hwaiyu Geng
Publisher: McGraw-Hill Education
ISBN: 9781259587696
Format: PDF, ePub
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Thoroughly Revised, State-of-the-Art Semiconductor Design, Manufacturing, and Operations Information Written by 70 international experts and reviewed by a seasoned technical advisory board, this fully updated resource clearly explains the cutting-edge processes used in the design and fabrication of IC chips, MEMS, sensors, and other electronic devices. Semiconductor Manufacturing Handbook, Second Edition, covers the emerging technologies that enable the Internet of Things, the Industrial Internet of Things, data analytics, artificial intelligence, augmented reality, and and smart manufacturing. You will get complete details on semiconductor fundamentals, front- and back-end processes, nanotechnology, photovoltaics, gases and chemicals, fab yield, and operations and facilities. •Nanotechnology and microsystems manufacturing •FinFET and nanoscale silicide formation •Physical design for high-performance, low-power 3D circuits •Epitaxi, anneals, RTP, and oxidation •Microlithography, etching, and ion implantations •Physical, chemical, electrochemical, and atomic layer vapor deposition •Chemical mechanical planarization •Atomic force metrology •Packaging, bonding, and interconnects •Flexible hybrid electronics •Flat-panel,flexible display electronics, and photovoltaics •Gas distribution systems •Ultrapure water and filtration •Process chemicals handling and abatement •Chemical and slurry handling systems •Yield management, CIM, and factory automation •Manufacturing execution systems •Advanced process control •Airborne molecular contamination •ESD controls in clean-room environments •Vacuum systems and RF plasma systems •IC manufacturing parts cleaning technology •Vibration and noise design •And much more