Identification of Defects in Semiconductors

Author:
Publisher: Academic Press
ISBN: 9780127521596
Format: PDF, Kindle
Download Now
Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors.The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices,Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded.Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry.

Identification of Defects in Semiconductors

Author:
Publisher: Academic Press
ISBN: 9780127521657
Format: PDF, Docs
Download Now
GENERAL DESCRIPTION OF THE SERIES Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The "Willardson and Beer" Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded. Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry. GENERAL DESCRIPTION OF THE VOLUME This volume has contributions on Advanced Characterization Techniques with a focus on defect identification. The combination of beam techniques with electrical and optical characterization has not been discussed elsewhere.

Identification of Defects in Semiconductors

Author:
Publisher: Academic Press
ISBN: 9780080864495
Format: PDF, Docs
Download Now
GENERAL DESCRIPTION OF THE SERIES Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The "Willardson and Beer" Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded. Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry. GENERAL DESCRIPTION OF THE VOLUME This volume has contributions on Advanced Characterization Techniques with a focus on defect identification. The combination of beam techniques with electrical and optical characterization has not been discussed elsewhere.

Thin Film Diamond II

Author: Christopher Nebel
Publisher: Elsevier
ISBN: 9780080541044
Format: PDF, ePub, Docs
Download Now
Part II reviews the state of the art of thin film diamond a very promising new semiconductor that may one day rival silicon as the material of choice for electronics. Diamond has the following important characteristics; it is resistant to radiation damage, chemically inert and biocompatible and it will become "the material" for bio-electronics, in-vivo applications, radiation detectors and high-frequency devices. Thin-Film Diamond II is the first book to summarize state of the art of CVD diamond in depth. It covers the most recent results regarding growth and structural properties, doping and defect characterization, hydrogen in and on diamond as well as surface properties in general, applications of diamond in electrochemistry, as detectors, and in surface acoustic wave devices * Accessible by both experts and non-experts in the field of semi-conductors research and technology, each chapter is written in a tutorial format· * Assisting engineers to manufacture devices with optimized electronic properties· * Truly international, this volume contains chapters written by recognized experts representing academic and industrial institutions from Europe, Japan and the US

Optical Absorption of Impurities and Defects in Semiconducting Crystals

Author: Bernard Pajot
Publisher: Springer Science & Business Media
ISBN: 3642180183
Format: PDF, Mobi
Download Now
This book outlines, with the help of several specific examples, the important role played by absorption spectroscopy in the investigation of deep-level centers introduced in semiconductors and insulators like diamond, silicon, germanium and gallium arsenide by high-energy irradiation, residual impurities, and defects produced during crystal growth. It also describes the crucial role played by vibrational spectroscopy to determine the atomic structure and symmetry of complexes associated with light impurities like hydrogen, carbon, nitrogen and oxygen, and as a tool for quantitative analysis of these elements in the materials.

Photonics and Electronics with Germanium

Author: Kazumi Wada
Publisher: John Wiley & Sons
ISBN: 3527328211
Format: PDF, Mobi
Download Now
Representing a further step towards enabling the convergence of computing and communication, this handbook and reference treats germanium electronics and optics on an equal footing. Renowned experts paint the big picture, combining both introductory material and the latest results. The first part of the book introduces readers to the fundamental properties of germanium, such as band offsets, impurities, defects and surface structures, which determine the performance of germanium-based devices in conjunction with conventional silicon technology. The second part covers methods of preparing and processing germanium structures, including chemical and physical vapor deposition, condensation approaches and chemical etching. The third and largest part gives a broad overview of the applications of integrated germanium technology: waveguides, photodetectors, modulators, ring resonators, transistors and, prominently, light-emitting devices. An invaluable one-stop resource for both researchers and developers.

Characterization of Polymer Blends

Author: Sabu Thomas
Publisher: John Wiley & Sons
ISBN: 3527645616
Format: PDF, Docs
Download Now
Filling the gap for a reference dedicated to the characterization of polymer blends and their micro and nano morphologies, this book provides comprehensive, systematic coverage in a one-stop, two-volume resource for all those working in the field. Leading researchers from industry and academia, as well as from government and private research institutions around the world summarize recent technical advances in chapters devoted to their individual contributions. In so doing, they examine a wide range of modern characterization techniques, from microscopy and spectroscopy to diffraction, thermal analysis, rheology, mechanical measurements and chromatography. These methods are compared with each other to assist in determining the best solution for both fundamental and applied problems, paying attention to the characterization of nanoscale miscibility and interfaces, both in blends involving copolymers and in immiscible blends. The thermodynamics, miscibility, phase separation, morphology and interfaces in polymer blends are also discussed in light of new insights involving the nanoscopic scale. Finally, the authors detail the processing-morphology-property relationships of polymer blends, as well as the influence of processing on the generation of micro and nano morphologies, and the dependence of these morphologies on the properties of blends. Hot topics such as compatibilization through nanoparticles, miscibility of new biopolymers and nanoscale investigations of interfaces in blends are also addressed. With its application-oriented approach, handpicked selection of topics and expert contributors, this is an outstanding survey for anyone involved in the field of polymer blends for advanced technologies.

Handbook of Semiconductor Technology Electronic structures and properties of semiconductors

Author: Kenneth A. Jackson
Publisher: Wiley-VCH Verlag GmbH
ISBN: 9783527298341
Format: PDF, ePub, Mobi
Download Now
Covering the structure and properties of semiconductors, this volume places particular emphasis on concepts relevant to semiconductor technology. Of interest to physicists and engineers in research and in the electronics industry, this is a valuable reference source and state-of-the-art review by the world's top authors.