Noncontact Atomic Force Microscopy

Author: Seizo Morita
Publisher: Springer
ISBN: 3319155881
Format: PDF, Kindle
Download Now
This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Noncontact Atomic Force Microscopy

Author: S. Morita
Publisher: Springer Science & Business Media
ISBN: 9783540431176
Format: PDF, Docs
Download Now
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Scanning Probe Microscopy

Author: Bert Voigtlaender
Publisher: Springer
ISBN: 3662452405
Format: PDF, Docs
Download Now
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 9783642104978
Format: PDF
Download Now
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy

Author: Philip Moriarty
Publisher: Springer
ISBN: 3319174010
Format: PDF
Download Now
Imaging and Manipulation of Adsorbates using Dynamic Force Microscopy provides an overview of the latest developments in dynamic force microscopy (DFM) of atoms, molecules, and nanoparticles adsorbed on solid surfaces. Significant advances in the capabilities of this technique have been made in the last decade and this book represents a timely snapshot of the major research themes in the field, with a particular focus on the manipulation of matter at the atomic and (sub)molecular levels. This edited volume will be of keen interest to researchers active in nanoscience and its various sub-fields including, in particular, scanning probe microscopy. This book expands on the previous volumes in the series Advances in Atom and Single Molecule Machines. DFM is an exceptionally powerful tool for the imaging and probing of adsorbates on insulators and is now a component of the type of multiprobe interconnection systems described in Vol. 1 of the series. DFM can also be used to translate atoms and molecules in the context of the fabrication of the type of logic gates described in Vol. 2. When used in conjunction with STM, DFM also enables a detailed comparison of the chemical ‘architecture’ of a molecule with the spatial distribution of its orbital density, as described in Vol. 3. In this book readers will gain key insights into the current capabilities, and future potential, of dynamic force microscopy.

Surface Science Tools for Nanomaterials Characterization

Author: Challa S.S.R. Kumar
Publisher: Springer
ISBN: 3662445514
Format: PDF, ePub, Mobi
Download Now
Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 3

Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 3642254144
Format: PDF, Docs
Download Now
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Comprehensive Nanoscience and Technology

Author:
Publisher: Academic Press
ISBN: 9780123743961
Format: PDF, ePub, Mobi
Download Now
From the Introduction: Nanotechnology and its underpinning sciences are progressing with unprecedented rapidity. With technical advances in a variety of nanoscale fabrication and manipulation technologies, the whole topical area is maturing into a vibrant field that is generating new scientific research and a burgeoning range of commercial applications, with an annual market already at the trillion dollar threshold. The means of fabricating and controlling matter on the nanoscale afford striking and unprecedented opportunities to exploit a variety of exotic phenomena such as quantum, nanophotonic and nanoelectromechanical effects. Moreover, researchers are elucidating new perspectives on the electronic and optical properties of matter because of the way that nanoscale materials bridge the disparate theories describing molecules and bulk matter. Surface phenomena also gain a greatly increased significance; even the well-known link between chemical reactivity and surface-to-volume ratio becomes a major determinant of physical properties, when it operates over nanoscale dimensions. Against this background, this comprehensive work is designed to address the need for a dynamic, authoritative and readily accessible source of information, capturing the full breadth of the subject. Its six volumes, covering a broad spectrum of disciplines including material sciences, chemistry, physics and life sciences, have been written and edited by an outstanding team of international experts. Addressing an extensive, cross-disciplinary audience, each chapter aims to cover key developments in a scholarly, readable and critical style, providing an indispensible first point of entry to the literature for scientists and technologists from interdisciplinary fields. The work focuses on the major classes of nanomaterials in terms of their synthesis, structure and applications, reviewing nanomaterials and their respective technologies in well-structured and comprehensive articles with extensive cross-references. It has been a constant surprise and delight to have found, amongst the rapidly escalating number who work in nanoscience and technology, so many highly esteemed authors willing to contribute. Sharing our anticipation of a major addition to the literature, they have also captured the excitement of the field itself in each carefully crafted chapter. Along with our painstaking and meticulous volume editors, full credit for the success of this enterprise must go to these individuals, together with our thanks for (largely) adhering to the given deadlines. Lastly, we record our sincere thanks and appreciation for the skills and professionalism of the numerous Elsevier staff who have been involved in this project, notably Fiona Geraghty, Megan Palmer and Greg Harris, and especially Donna De Weerd-Wilson who has steered it through from its inception. We have greatly enjoyed working with them all, as we have with each other.

Atomic Force Microscopy Scanning Nearfield Optical Microscopy and Nanoscratching

Author: Gerd Kaupp
Publisher: Springer Science & Business Media
ISBN: 3540284729
Format: PDF, ePub, Mobi
Download Now
Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

Atomic Force Microscopy in Nanobiology

Author: Kunio Takeyasu
Publisher: CRC Press
ISBN: 9814411590
Format: PDF, ePub, Mobi
Download Now
Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement. All these techniques are now highly powerful not only in material sciences but also in basic biological sciences. There are many nanotechnology books that focus on materials, instruments, and applications in engineering and medicine, but only a few of them are directed toward basic biological sciences. This book tries to bridge this gap. Edited by a prominent researcher, this volume provides an overview of modern AFM technologies: the basic AFM protocols in Part I, newly developed technologies in Part II, and the most recent applications of AFM technologies in biological sciences in Parts III and IV. The chapters are contributed by some of the leading scientists in the field of nanobiology.