Noncontact Atomic Force Microscopy

Author: Seizo Morita
Publisher: Springer
ISBN: 3319155881
Format: PDF, Docs
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This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

Noncontact Atomic Force Microscopy

Author: S. Morita
Publisher: Springer Science & Business Media
ISBN: 9783540431176
Format: PDF, Kindle
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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Scanning Probe Microscopy

Author: Bert Voigtlaender
Publisher: Springer
ISBN: 3662452405
Format: PDF
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This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Noncontact Atomic Force Microscopy

Author: Seizo Morita
Publisher: Springer Science & Business Media
ISBN: 364201495X
Format: PDF
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Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Surface Science Tools for Nanomaterials Characterization

Author: Challa S.S.R. Kumar
Publisher: Springer
ISBN: 3662445514
Format: PDF, ePub
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Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

Comprehensive Nanoscience and Technology

Author:
Publisher: Academic Press
ISBN: 9780123743961
Format: PDF, Docs
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From the Introduction: Nanotechnology and its underpinning sciences are progressing with unprecedented rapidity. With technical advances in a variety of nanoscale fabrication and manipulation technologies, the whole topical area is maturing into a vibrant field that is generating new scientific research and a burgeoning range of commercial applications, with an annual market already at the trillion dollar threshold. The means of fabricating and controlling matter on the nanoscale afford striking and unprecedented opportunities to exploit a variety of exotic phenomena such as quantum, nanophotonic and nanoelectromechanical effects. Moreover, researchers are elucidating new perspectives on the electronic and optical properties of matter because of the way that nanoscale materials bridge the disparate theories describing molecules and bulk matter. Surface phenomena also gain a greatly increased significance; even the well-known link between chemical reactivity and surface-to-volume ratio becomes a major determinant of physical properties, when it operates over nanoscale dimensions. Against this background, this comprehensive work is designed to address the need for a dynamic, authoritative and readily accessible source of information, capturing the full breadth of the subject. Its six volumes, covering a broad spectrum of disciplines including material sciences, chemistry, physics and life sciences, have been written and edited by an outstanding team of international experts. Addressing an extensive, cross-disciplinary audience, each chapter aims to cover key developments in a scholarly, readable and critical style, providing an indispensible first point of entry to the literature for scientists and technologists from interdisciplinary fields. The work focuses on the major classes of nanomaterials in terms of their synthesis, structure and applications, reviewing nanomaterials and their respective technologies in well-structured and comprehensive articles with extensive cross-references. It has been a constant surprise and delight to have found, amongst the rapidly escalating number who work in nanoscience and technology, so many highly esteemed authors willing to contribute. Sharing our anticipation of a major addition to the literature, they have also captured the excitement of the field itself in each carefully crafted chapter. Along with our painstaking and meticulous volume editors, full credit for the success of this enterprise must go to these individuals, together with our thanks for (largely) adhering to the given deadlines. Lastly, we record our sincere thanks and appreciation for the skills and professionalism of the numerous Elsevier staff who have been involved in this project, notably Fiona Geraghty, Megan Palmer and Greg Harris, and especially Donna De Weerd-Wilson who has steered it through from its inception. We have greatly enjoyed working with them all, as we have with each other.

Imaging and Manipulation of Adsorbates Using Dynamic Force Microscopy

Author: Philip Moriarty
Publisher: Springer
ISBN: 3319174010
Format: PDF, ePub, Docs
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Imaging and Manipulation of Adsorbates using Dynamic Force Microscopy provides an overview of the latest developments in dynamic force microscopy (DFM) of atoms, molecules, and nanoparticles adsorbed on solid surfaces. Significant advances in the capabilities of this technique have been made in the last decade and this book represents a timely snapshot of the major research themes in the field, with a particular focus on the manipulation of matter at the atomic and (sub)molecular levels. This edited volume will be of keen interest to researchers active in nanoscience and its various sub-fields including, in particular, scanning probe microscopy. This book expands on the previous volumes in the series Advances in Atom and Single Molecule Machines. DFM is an exceptionally powerful tool for the imaging and probing of adsorbates on insulators and is now a component of the type of multiprobe interconnection systems described in Vol. 1 of the series. DFM can also be used to translate atoms and molecules in the context of the fabrication of the type of logic gates described in Vol. 2. When used in conjunction with STM, DFM also enables a detailed comparison of the chemical ‘architecture’ of a molecule with the spatial distribution of its orbital density, as described in Vol. 3. In this book readers will gain key insights into the current capabilities, and future potential, of dynamic force microscopy.

Atomic Force Microscopy in Nanobiology

Author: Kunio Takeyasu
Publisher: CRC Press
ISBN: 9814411590
Format: PDF, ePub
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Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement. All these techniques are now highly powerful not only in material sciences but also in basic biological sciences. There are many nanotechnology books that focus on materials, instruments, and applications in engineering and medicine, but only a few of them are directed toward basic biological sciences. This book tries to bridge this gap. Edited by a prominent researcher, this volume provides an overview of modern AFM technologies: the basic AFM protocols in Part I, newly developed technologies in Part II, and the most recent applications of AFM technologies in biological sciences in Parts III and IV. The chapters are contributed by some of the leading scientists in the field of nanobiology.

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2

Author: Bharat Bhushan
Publisher: Springer Science & Business Media
ISBN: 9783642104978
Format: PDF, Docs
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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Scanning Probe Microscopy for Energy Research

Author: Dawn A Bonnell
Publisher: World Scientific
ISBN: 9814434728
Format: PDF, ePub, Docs
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Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field. Contents:Introduction:Local Probes in the Next Decade of Energy Research: Bridging Macroscopic and Atomic Worlds (D A Bonnell and S V Kalinin)Scanning Probes for Energy Harvesting Systems: Photovoltaics and Solar Cells:Electrical Scanning Probe Microscopy on Solar Cell Materials (R Giridharagopal, G E Rayermann and D S Ginger)Organic Solar Cell Materials and Devices Characterized by Conductive and Photoconductive Atomic Force Microscopy (X-D Dang, M Guide and T-Q Nguyen)Kelvin Probe Force Microscopy for Solar Cell Applications (T Glatzel)Reversible Rectification in Sub-Monolayer Molecular P-N Junctions: Towards Nanoscale Photovoltaic Studies (J A Smerdon, N C Giebink and J R Guest)Study of Photoinduced Charges with Atomic Force Microscopy (M Dokukin, N Guz and I Sokolov)Imaging of Nanoscale Photogenerated Charge Transport in Organic Photovoltaic Materials (B Hamadani, P M Haney and N B Zhitenev)Photoassisted Kelvin Probe Force Microscopy for Characterization of Solar Cell Materials (T Takahashi)Scanning Probes for Fuel Cells and Local Electrochemistry:Electrochemical Strain Microscopy of Oxygen-Ion Conductors: Fuel Cells and Oxide Electronics (A Kumar, S Jesse, S V Kalinin, F Ciucci and A Morozovska)Ion Dynamics in Nanoscopic Subvolumes of Solid Electrolytes Analysed by Electrostatic Force Spectroscopy (A Schirmeisen and B Roling)Nanoscale Electrochemistry in Energy Related Systems Using Atomic Force Microscopy (W Lee, M H Lee, R P O'Hayre and F B Prinz)Scanning Probe Microscopy of Fuel Cell Materials Under Realistic Operating Conditions (S S Nonnenmann and D A Bonnell)Scanning Probe Microscopy of Energy Storage Materials and Devices:In situ SPM Analysis of Interfacial Phenomena in Lithium-Ion Batteries (M Inaba, S-K Jeong and Z Ogumi)Conducting-Probe Atomic Force Microscopy of Electrochemical Interfaces (P A Veneman and K J Stevenson)Electrochemical Strain Microscopy of Li-ion and Li-air Battery Materials (T M Arruda, N Balke, S Jesse and S V Kalinin)Emerging Scanning Probe Techniques:High Sensitivity Scanning Impedance Microscopy and Spectroscopy (S S Nonnenmann, X Chen and D A Bonnell)Scanning Microwave Microscopy: Advances in Quantitative Capacitance and Carrier Density Measurements at the Nanometer Scale (S Wu, F Kienberger and H Tanbakuchi)Mapping Electrochemistry at the Micro and Nanoscales with Scanning Ion Conductance Microscopy (C Laslau, D E Williams and J Travas-Sejdic)Force Microscopy, Nanochemistry and Nanofabrication (R Garcia, M Chiesa and Y K Ryu)Studying the Mechanism of Piezoelectric Nanogenerators (J Song and Z L Wang) Readership: Students, professionals and researchers in materials science, nanomaterials and new materials. Keywords:Energy Materials;Scanning Probe Microscopy;Fuel Cells;Photovoltaics;Batteries;Solar CellsKey Features:A first broad overview of SPM for energy materials and devicesWritten by world leaders in scanning probe microscopyContains both applications of established SPM techniques as well as overview of novel emergent methods and addresses applications in all major arenas of energy: alternative energy generation, energy harvesting, and storage