Advances in Imaging and Electron Physics

Author:
Publisher: Academic Press
ISBN: 0123978149
Format: PDF, ePub, Docs
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This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Contributions from leading authorities Informs and updates on all the latest developments in the field

X Ray Fluorescence Spectrometry

Author: Ron Jenkins
Publisher: John Wiley & Sons
ISBN: 1118521048
Format: PDF, Kindle
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X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade. Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra. Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of X-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis-from specimen preparation to real-world industrial application. Favored by the American Chemical Society and the International Centre for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists-in chemical analysis, geology, metallurgy, and materials science. An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes: * The history of X-ray fluorescence spectrometry-new to this edition. * A critical review of the most useful X-ray spectrometers. * Techniques and procedures for quantitative and qualitative analysis. * Modern applications and industrial trends. * X-ray spectra-new to this edition.

An Introduction to X Ray Physics Optics and Applications

Author: Carolyn A. MacDonald
Publisher: Princeton University Press
ISBN: 1400887739
Format: PDF, Docs
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In this book, Carolyn A. MacDonald provides a comprehensive introduction to the physics of a wide range of x-ray applications, optics, and analysis tools. Theory is applied to practical considerations of optics and applications ranging from astronomy to medical imaging and materials analysis. Emphasizing common physical concepts that underpin diverse phenomena and applications of x-ray physics, the book opens with a look at nuclear medicine, motivating further investigations into scattering, detection, and noise statistics. The second section explores topics in x-ray generation, including characteristic emission, x-ray fluorescence analysis, bremsstrahlung emission, and synchrotron and laser sources. The third section details the main forms of interaction, including the physics of photoelectric absorption, coherent and Compton scattering, diffraction, and refractive, reflective, and diffractive optics. Applications in this section include x-ray spectroscopy, crystallography, and dose and contrast in radiography. A bibliography is included at the end of every chapter, and solutions to chapter problems are provided in the appendix. Based on a course for advanced undergraduates and graduate students in physics and related sciences and also intended for researchers, An Introduction to X-Ray Physics, Optics, and Applications offers a thorough survey of the physics of x-ray generation and of interaction with materials. Common aspects of diverse phenomena emphasized Theoretical development tied to practical applications Suitable for advanced undergraduate and graduate students in physics or related sciences, as well as researchers Examples and problems include applications drawn from medicine, astronomy, and materials analysis Detailed solutions are provided for all examples and problems

X Ray Fluorescence Spectrometry XRF in Geoarchaeology

Author: M. Steven Shackley
Publisher: Springer Science & Business Media
ISBN: 9781441968869
Format: PDF, Docs
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Since the 1960s, x-ray fluorescence spectrometry (XRF), both wavelength and energy-dispersive have served as the workhorse for non-destructive and destructive analyses of archaeological materials. Recently eclipsed by other instrumentation such as LA-ICP-MS, XRF remains the mainstay of non-destructive chemical analyses in archaeology, particularly for volcanic rocks, and most particularly for obsidian. In a world where heritage and repatriation issues drive archaeological method and theory, XRF remains an important tool for understanding the human past, and will remain so for decades to come. Currently, there is no comprehensive book in XRF applications in archaeology at a time when the applications of portable XRF and desktop XRF instrumentation are exploding particularly in anthropology and archaeology departments worldwide. The contributors to this volume are the experts in the field, and most are at the forefront of the newest applications of XRF to archaeological problems. It covers all relevant aspects of the field for those using the newest XRF technologies to deal with very current issues in archaeology.

Total Reflection X Ray Fluorescence Analysis and Related Methods

Author: Reinhold Klockenkämper
Publisher: John Wiley & Sons
ISBN: 1118460278
Format: PDF, Docs
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Providing an accessible introduction into the use of Total-Reflection X-ray Fluorescence (TXRF) Analysis, both from a theoretical point of view and for practical applications, this new edition ofTotal-Reflection X-Ray Fluorescence Analysis is completely updated and enlarged to emphasize new methods and techniques. Written to enable students and scientists to evaluate the suitability of a TXRF method for their specific needs, the text provides an overview to the physical fundamentals and principles of Total-Reflection X-ray Fluorescence (TXRF) Analysis, explains instrumentation and setups, and describes applications in a great variety of disciplines.

Information Theory in Analytical Chemistry

Author: Karel Eckschlager
Publisher: John Wiley & Sons
ISBN: 9780471595076
Format: PDF, Docs
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Complete with up-to-date examples from diverse areas such as toxicology, environmental science, and metallurgy, the book provides a workable framework for developing, optimizing, and assessing analytical procedures.

Portable X ray Fluorescence Spectrometry

Author: P. J. Potts
Publisher: Royal Society of Chemistry
ISBN: 085404552X
Format: PDF, ePub, Docs
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This book brings together the knowledge and expertise of internationally recognised scientists with practical experience of in situ analysis using portable X-ray fluorescence technology.

Total reflection X ray fluorescence analysis

Author: R. Klockenkämper
Publisher: Wiley-Interscience
ISBN:
Format: PDF, Mobi
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Over the past decade, total-reflection X-ray fluorescence, or TXRF, has been used increasingly for multi element analysis in laboratories and industry worldwide. Providing reliable, economical readings of the minute mass or low concentration of elements, TXRF is especially suitable for micro- and trace analysis. It is also effective in the analysis of flat sample surfaces and stratified near-surface layers, offering a nondestructive means of quality control of wafers for the semiconductor industry. This is the first book dedicated to this powerful and highly efficient analytical tool. Written by a leading expert with three decades of specialization in X-ray spectral analysis, it features a remarkably readable treatment complete with hundreds of illustrations, equations, and references. Using only a minimum of mathematics, the author focuses on practical applications of TXRF in a variety of disciplines, including geology, biology, material and environmental sciences, medicine, forensics, and art history. The book begins with an introduction to the physical fundamentals of X-ray fluorescence and the principles of total reflection. A survey of TXRF instruments and their operation includes high-power X-ray sources, beam-adapting units, sample positioning, and energy-dispersive detection and registration. Professor Klockenkämper shows readers how to perform analyses, using sample prepa-ration and spectra recording and interpretation, and presents real-world examples from environmental, medical, industrial, art-historical, and forensic applications. The book closes with a discussion of the latest developments in the field, drawing a comparison between TXRF and other methods of analytical atomic spectroscopy. Total-Reflection X-Ray Fluores-cence Analysis helps professionals evaluate the suitability of this method to their specific needs, pinpoint new applications, and gain insight into the future of TXRF. It is an excellent text for graduate students and a useful guide for scientists and technicians in a wide range of fields. This is the first monograph to be devoted entirely to total- reflection X-ray fluorescence (TXRF)-a young, yet powerful method of analytical atomic spectroscopy. Written by a leading expert in X-ray spectral analysis, the book provides an overview of the field, reveals the advantages of TXRF over competing methods, and describes its application in numerous disciplines, including geology, biology, material and environmental sciences, medicine, toxicology, forensics, art history, and archaeology. Tables, figures, equations, and examples are provided throughout. The author discusses both theory and techniques, and walks the reader through the necessary steps to get highly reliable determinations of the minute mass or low concentration of elements. Remarkably communicative and accessible, this book * Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis * Explains instrumentation and setups, particularly high-power X-ray sources, beam-adapting units, sample positioning, and energy-dispersive detection and registration * Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation * Features real-world examples from a variety of disciplines * Includes hundreds of references for further study

Raman Spectroscopy for Chemical Analysis

Author: Richard L. McCreery
Publisher: John Wiley & Sons
ISBN: 0471231878
Format: PDF, Docs
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Owing to its unique combination of high information content and ease of use, Raman spectroscopy, which uses different vibrational energy levels to excite molecules (as opposed to light spectra), has attracted much attention over the past fifteen years. This book covers all aspects of modern Raman spectroscopy, including its growing use in both the laboratory and industrial analysis.